Dashboard Mode - Design for testability (DFT)
Business Question
How can we monitor and improve the test coverage and fault detection efficiency in our PCB designs using Design for Testability (DFT) metrics?
How can we monitor and improve the test coverage and fault detection efficiency in our PCB designs using Design for Testability (DFT) metrics?
| PCB_ID | Test_Points | Tested_Points | Faults_Detected | Total_Faults | Test_Time_Minutes |
|---|---|---|---|---|---|
| PCB001 | 100 | 95 | 5 | 6 | 30 |
| PCB002 | 120 | 110 | 8 | 10 | 40 |
| PCB003 | 90 | 85 | 4 | 5 | 25 |
| PCB004 | 150 | 140 | 12 | 15 | 50 |
| PCB005 | 80 | 75 | 3 | 4 | 20 |
Average Test Coverage = AVERAGE(Tested_Points / Test_Points * 100)Average Fault Detection Rate = AVERAGE(Faults_Detected / Total_Faults * 100)Average Test Time = AVERAGE(Test_Time_Minutes)+--------------------------------------------------+ | Average Test Coverage (%) | Average Fault Detection Rate (%) | Average Test Time (min) | +--------------------------+--------------------------------+-------------------------+ | Bar Chart: Test Coverage per PCB | +--------------------------------------------------------------------------+ | Bar Chart: Fault Detection Rate per PCB | +--------------------------------------------------------------------------+ | Table: Detailed PCB Test Data | +--------------------------------------------------------------------------+
A filter slicer for PCB_ID allows selecting one or multiple PCBs. When a PCB_ID is selected:
This helps focus on specific PCB designs to analyze their testability performance.
If you add a filter to select only PCB002 and PCB004, which components update and what are the new average test coverage and fault detection rate?
Calculations: